Frank Altmann

According to our database, Frank Altmann authored at least 19 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.

Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Christian Große, Frank Altmann

CoRR, 2023

Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.

Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Frank Altmann

Proceedings of the 2023 Workshop on Attacks and Solutions in Hardware Security, 2023

2021

Nano Security: From Nano-Electronics to Secure Systems.

Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR).

Michael Kögel, Sebastian Brand, Christian Große, Kristof J. P. Jacobs, Ingrid De Wolf, Frank Altmann

Proceedings of the 17th IEEE International Conference on Automation Science and Engineering, 2021

2020

Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.

Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.

Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Physical failure analysis methods for wide band gap semiconductor devices.

Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Exploring the thermal limit of GaN power devices under extreme overload conditions.

Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, Frank Altmann, David Poppitz, A. Lindemann

Microelectron. Reliab., 2017

High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.

Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck

Microelectron. Reliab., 2017

2016

Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.

Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann

Microelectron. Reliab., 2016

Reliability evaluation of Si-dies due to assembly issues.

Falk Naumann, Volkmar Gottschalk, Bernd Burchard, Frank Altmann

Microelectron. Reliab., 2016

Magnetic field and current density imaging using off-line lock-in analysis.

Michael Kögel, Frank Altmann, Sebastian Tismer, Sebastian Brand

Microelectron. Reliab., 2016

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.

Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck

Microelectron. Reliab., 2016

Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy.

Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann

Microelectron. Reliab., 2016

Innovative Failure Analysis Techniques for 3-D Packaging Developments.

Frank Altmann, Matthias Petzold

IEEE Des. Test, 2016

2014

Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.

Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff

Microelectron. Reliab., 2014

2012

Novel techniques for dopant contrast analysis on real IC structures.

Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann

Microelectron. Reliab., 2012

2010

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.

Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li

Microelectron. Reliab., 2010

2006

Lock-in thermal IR imaging using a solid immersion lens.

O. Breitenstein, Frank Altmann, Thorsten Riediger, D. Karg, V. Gottschalk

Microelectron. Reliab., 2006