Salem Abdennadher

According to our database, Salem Abdennadher authored at least 11 papers between 1993 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps PAM4 SerDes.

Salem Abdennadher, Kyle Tripician, Senthil Singaravelu

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Analog/Mixed Signal IP DFx from a Foundry perspective.

Salem Abdennadher, Arani Sinha, Yonghyun Kim

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

Challenges and emerging solutions in testing HBM IO & systems.

Salem Abdennadher, Michael Altmann, Bin Xue

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT.

Horaira Abu, Salem Abdennadher, Benoit Provost, Harry Muljono

Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

2016

Practices in High-Speed IO testing.

Salem Abdennadher, Saghir A. Shaikh

Proceedings of the 21th IEEE European Test Symposium, 2016

2012

Improving IO test and system evaluation via data sharing.

Anne Meixner, Salem Abdennadher

Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2008

Effects of Advances in Analog, Mixed Signal and IO Circuits on Test Strategies.

Salem Abdennadher

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Practices in Mixed-Signal and RF IC Testing.

Salem Abdennadher, Saghir A. Shaikh

IEEE Des. Test Comput., 2007

2005

Challenges in High Speed Interface Testing.

Salem Abdennadher, Saghir A. Shaikh

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

Practices in Testing of Mixed-Signal and RF SoCs.

Salem Abdennadher, Saghir A. Shaikh

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

1993

Adaptive Digital Correction for Dual Quantization Sigma-Delta Modulators.

Sayfe Kiaei, Salem Abdennadher, Gabor C. Temes, Yaohua Yang

Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993