Sanjay Parihar

According to our database1, Sanjay Parihar authored at least 7 papers between 2014 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2020
Bias-Dependent Variation in FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst., 2020

An Energy-Efficient and High Throughput in-Memory Computing Bit-Cell With Excellent Robustness Under Process Variations for Binary Neural Network.
IEEE Access, 2020

2019
An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst., 2019

2016
Rapid Assessment of Design Sensitivity to Process Excursions via Scaled Sigma Sampling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Employing Scaled Sigma Sampling for Efficient Estimation of Rare Event Probabilities in the Absence of Input Domain Mapping.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

2015
SRAM Vmax stability considerations.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
FinFET SRAM design challenges.
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014


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