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Saqib A. Khan

According to our database1, Saqib A. Khan authored at least 3 papers between 2016 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2017
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.
[BibTeX]
[DOI]
Saqib A. Khan
,
Chul Seung Lim
,
GeunYong Bak
,
Sanghyeon Baeg
,
Soonyoung Lee
Microelectron. Reliab., 2017

2016
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627].
[BibTeX]
[DOI]
Saqib A. Khan
,
Shi-Jie Wen
,
Sanghyeon Baeg
IEICE Electron. Express, 2016

Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation.
[BibTeX]
[DOI]
Saqib A. Khan
,
Shi-Jie Wen
,
Sanghyeon Baeg
IEICE Electron. Express, 2016


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