Shi-Jie Wen

According to our database1, Shi-Jie Wen authored at least 54 papers between 2008 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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On csauthors.net:

Bibliography

2024
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Generative Anomaly Detection for Time Series Datasets.
CoRR, 2022

Traffic Anomaly Detection Via Conditional Normalizing Flow.
Proceedings of the 25th IEEE International Conference on Intelligent Transportation Systems, 2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Spatio-temporal AI inference engine for estimating hard disk reliability.
Pervasive Mob. Comput., 2021

Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation.
IEEE Access, 2021

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020
High-Current State triggered by Operating-Frequency Change.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Use of Silicon-based Sensors for System Reliability Prediction.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer.
IEEE J. Solid State Circuits, 2019

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.
Microelectron. Reliab., 2018

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.
Microelectron. Reliab., 2018

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

Single-event effects on optical transceiver.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device.
Microelectron. Reliab., 2017

BPPT - Bulk potential protection technique for hardened sequentials.
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

IZIP: In-place zero overhead interconnect protection via PIP redundancy.
Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627].
IEICE Electron. Express, 2016

Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation.
IEICE Electron. Express, 2016

2015
New insights into the impact of SEUs in FPGA CRAMs.
IEICE Electron. Express, 2015

Terrestrial SER characterization for nanoscale technologies: A comparative study.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Analysis of advanced circuits for SET measurement.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection.
Microelectron. Reliab., 2014

Single Event Resilient Dynamic Logic Designs.
J. Electron. Test., 2014

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.
J. Electron. Test., 2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.
Microprocess. Microsystems, 2013

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients.
J. Electron. Test., 2013

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.
J. Electron. Test., 2013

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.
Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.
Proceedings of the International Symposium on Quality Electronic Design, 2013

Placement of repair circuits for in-field FPGA repair.
Proceedings of the 2013 ACM/SIGDA International Symposium on Field Programmable Gate Arrays, 2013

Error detection in ternary CAMs using bloom filters.
Proceedings of the Design, Automation and Test in Europe, 2013

Networking industry trends in ESD protection for high speed IOs.
Proceedings of the IEEE 10th International Conference on ASIC, 2013

2012
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS.
IEEE Trans. Circuits Syst. I Regul. Pap., 2012

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.
J. Electron. Test., 2012

RIIF - Reliability information interchange format.
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs.
Proceedings of the 2012 International Conference on Field-Programmable Technology, 2012

2011
Mitigating the effects of large multiple cell upsets (MCUs) in memories.
ACM Trans. Design Autom. Electr. Syst., 2011

Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS.
IEEE J. Solid State Circuits, 2011

Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.
Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms.
Proceedings of the International Conference on Field Programmable Logic and Applications, 2011

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS.
Proceedings of the 16th European Test Symposium, 2011

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS.
Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2010
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals.
IEEE Trans. Circuits Syst. I Regul. Pap., 2010

2008
A Systematical Method of Quantifying SEU FIT.
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008


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