According to our database1, GeunYong Bak
Legend:Book In proceedings Article PhD thesis Other
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.
Microelectronics Reliability, 2018
An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.
Microelectronics Reliability, 2017
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.
Proceedings of the IEEE International Reliability Physics Symposium, 2015