Chul Seung Lim

According to our database, Chul Seung Lim authored at least 5 papers between 2012 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.

Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

Study of TID effects on one row hammering using gamma in DDR4 SDRAMs.

Donghyuk Yun, Myungsang Park, Chul Seung Lim, Sanghyeon Baeg

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.

Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee

Microelectron. Reliab., 2017

2016

Experiments and root cause analysis for active-precharge hammering fault in DDR3 SDRAM under 3 × nm technology.

Kyungbae Park, Chul Seung Lim, Donghyuk Yun, Sanghyeon Baeg

Microelectron. Reliab., 2016

2012

Soft Error Issues with Scaling Technologies.

Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam

Proceedings of the 21st IEEE Asian Test Symposium, 2012