Sara Vecchi

According to our database1, Sara Vecchi authored at least 4 papers between 2022 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2023
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022


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