Milan Pesic

According to our database, Milan Pesic authored at least 13 papers between 2016 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND.

Milan Pesic, Bastien Beltrando, Tommaso Rollo, Cristian Zambelli, Andrea Padovani, Rino Micheloni, Rita Maji, Lisa Enman, Mark Saly, Yang Ho Bae, Jung Bae Kim, Dong Kil Yim, Luca Larcher

Proceedings of the IEEE International Reliability Physics Symposium, 2023

The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging.

Lorenzo Benatti, Sara Vecchi, Milan Pesic, Francesco Maria Puglisi

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation.

Milan Pesic, Bastien Beltrando, Andrea Padovani, Toshihiko Miyashita, Nam-Sung Kim, Luca Larcher

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited).

Andrea Padovani, Milan Pesic, Federico Nardi, Valerio Milo, Luca Larcher, Mondol Anik Kumar, Zunaid Baten

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents.

Milan Pesic, Andrea Padovani, Tommaso Rollo, Bastien Beltrando, Jack Strand, Parnika Agrawal, Alexander L. Shluger, Luca Larcher

Proceedings of the IEEE International Memory Workshop, 2022

2021

Variability sources and reliability of 3D - FeFETs.

Milan Pesic, Bastien Beltrando, Andrea Padovani, Shruba Gangopadhyay, Muthukumar Kaliappan, Michael Haverty, Marco A. Villena, Enrico Piccinini, Matteo Bertocchi, Tony Chiang, Luca Larcher, Jack Strand, Alexander L. Shluger

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers.

Andrea Padovani, Milan Pesic, Mondol Anik Kumar, Pieter Blomme, Alexandre Subirats, Senthil Vadakupudhupalayam, Zunaid Baten, Luca Larcher

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Demonstration and Endurance Improvement of p-channel Hafnia-based Ferroelectric Field Effect Transistors.

Felix Winkler, Milan Pesic, Claudia Richter, Michael Hoffmann, Thomas Mikolajick, Johann W. Bartha

Proceedings of the Device Research Conference, 2019

2017

Gate stack engineering for emerging polarization based non-volatile memories.

Milan Pesic

PhD thesis, 2017

Anti-ferroelectric-like ZrO2 non-volatile memory: Inducing non-volatility within state-of-the-art DRAM.

Milan Pesic, Michael Hoffmann, Claudia Richter, Stefan Slesazeck, Uwe Schroeder, Thomas Mikolajick

Proceedings of the 17th Non-Volatile Memory Technology Symposium, 2017

Anti-ferroelectric ZrO2, an enabler for low power non-volatile 1T-1C and 1T random access memories.

Milan Pesic, Michael Hoffmann, Claudia Richter, Stefan Slesazeck, Thomas Kämpfe, Lukas M. Eng, Thomas Mikolajick, Uwe Schroeder

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016

Impact of field cycling on HfO2 based non-volatile memory devices.

Uwe Schroeder, Milan Pesic, Tony Schenk, Halid Mulaosmanovic, Stefan Slesazeck, Johannes Ocker, Claudia Richter, Ekaterina Yurchuk, K. Khullar, Johannes Müller, Patrick Polakowski, E. D. Grimley, J. M. LeBeau, Stefan Flachowsky, S. Jansen, Sabine Kolodinski, Ralf Van Bentum, Alfred Kersch, Christopher Künneth, Thomas Mikolajick

Proceedings of the 46th European Solid-State Device Research Conference, 2016

Comparison of hafnia and PZT based ferroelectrics for future non-volatile FRAM applications.

Franz P. G. Fengler, Milan Pesic, Sergej Starschich, Theodor Schneller, Ulrich Böttger, Tony Schenk, Min Hyuk Park, Thomas Mikolajick, Uwe Schroeder

Proceedings of the 46th European Solid-State Device Research Conference, 2016