Satoshi Masuda

According to our database, Satoshi Masuda authored at least 26 papers between 2003 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Datetime Feature Recommendation Using Textual Information.

Satoshi Masuda, Takaaki Tateishi, Toshihiro Takahashi

Proceedings of the Knowledge-Based and Intelligent Information & Engineering Systems: Proceedings of the 27th International Conference KES-2023, 2023

2022

Software Bug Prediction Model Based on Mathematical Graph Features Metrics.

Tomohiro Takeda, Satoshi Masuda, Kazuhiko Tsuda

Proceedings of the 15th IEEE International Conference on Software Testing, 2022

Software Test Architecture Definition by Analogy with Software Architecture.

Satoshi Masuda, Jon D. Hagar, Yasuharu Nishi, Kazuhiro Suzuki

Proceedings of the 15th IEEE International Conference on Software Testing, 2022

2021

2nd International Workshop on Data Quality Assessment for Machine Learning.

Hima Patel, Fuyuki Ishikawa, Laure Berti-Équille, Nitin Gupta, Sameep Mehta, Satoshi Masuda, Shashank Mujumdar, Shazia Afzal, Srikanta Bedathur, Yasuharu Nishi

Proceedings of the KDD '21: The 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, 2021

Data Quality for Machine Learning Tasks.

Nitin Gupta, Shashank Mujumdar, Hima Patel, Satoshi Masuda, Naveen Panwar, Sambaran Bandyopadhyay, Sameep Mehta, Shanmukha C. Guttula, Shazia Afzal, Ruhi Sharma Mittal, Vitobha Munigala

Proceedings of the KDD '21: The 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, 2021

Syntax-Tree Similarity for Test-Case Derivability in Software Requirements.

Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the 14th IEEE International Conference on Software Testing, 2021

Online Adaptation of Parameters using GRU-based Neural Network with BO for Accurate Driving Model.

Zhanhong Yang, Satoshi Masuda, Michiaki Tatsubori

Proceedings of the SIGSPATIAL '21: 29th International Conference on Advances in Geographic Information Systems, 2021

Spatially and semantically diverse points extraction using hierarchical clustering.

Naomi Simumba, Satoshi Masuda, Michiaki Tatsubori

Proceedings of the LocalRec '21: Proceedings of the 5th ACM SIGSPATIAL International Workshop on Location-based Recommendations, 2021

2020

Guidelines for Quality Assurance of Machine Learning-Based Artificial Intelligence.

Gaku Fujii, Koichi Hamada, Fuyuki Ishikawa, Satoshi Masuda, Mineo Matsuya, Tomoyuki Myojin, Yasuharu Nishi, Hideto Ogawa, Takahiro Toku, Susumu Tokumoto, Kazunori Tsuchiya, Yasuhiro Ujita

Int. J. Softw. Eng. Knowl. Eng., 2020

Guidelines for Quality Assurance of Machine Learning-based Artificial Intelligence.

Koichi Hamada, Fuyuki Ishikawa, Satoshi Masuda, Tomoyuki Myojin, Yasuharu Nishi, Hideto Ogawa, Takahiro Toku, Susumu Tokumoto, Kazunori Tsuchiya, Yasuhiro Ujita, Mineo Matsuya

Proceedings of the 32nd International Conference on Software Engineering and Knowledge Engineering, 2020

Complex Software Testing Analysis using International Standards.

Satoshi Masuda, Yasuharu Nishi, Kazuhiro Suzuki

Proceedings of the 13th IEEE International Conference on Software Testing, 2020

2019

Applying Change Impact Analysis Test to Migration Test Case Extraction Based on IDAU and Graph Analysis Techniques.

Tomohiro Takeda, Masakazu Takahashi, Tsuyoshi Yumoto, Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the 2019 IEEE International Conference on Software Testing, 2019

2018

Obtaining Exhaustive Answer Set for Q&A-based Inquiry System using Customer Behavior and Service Function Modeling.

Hironori Takeuchi, Satoshi Masuda, Kohtaroh Miyamoto, Shiki Akihara

Proceedings of the Knowledge-Based and Intelligent Information & Engineering Systems: Proceedings of the 22nd International Conference KES-2018, 2018

A Test Architecture for Machine Learning Product.

Yasuharu Nishi, Satoshi Masuda, Hideto Ogawa, Keiji Uetsuki

Proceedings of the 2018 IEEE International Conference on Software Testing, 2018

A Survey of Software Quality for Machine Learning Applications.

Satoshi Masuda, Kohichi Ono, Toshiaki Yasue, Nobuhiro Hosokawa

Proceedings of the 2018 IEEE International Conference on Software Testing, 2018

2017

Hierarchical context supplementation for consecutive question answering.

Kohtaroh Miyamoto, Hironori Takeuchi, Satoshi Masuda, Futoshi Iwama

Proceedings of the 2017 IEEE International Conference on Service Operations and Logistics, 2017

Software Testing Design Techniques Used in Automated Vehicle Simulations.

Satoshi Masuda

Proceedings of the 2017 IEEE International Conference on Software Testing, 2017

Messages from the InSTA 2017 Chairs.

Satoshi Masuda

Proceedings of the 2017 IEEE International Conference on Software Testing, 2017

Software Testing in Industry and Academia: A View of Both Sides in Japan.

Satoshi Masuda

Proceedings of the 2017 IEEE International Conference on Software Testing, 2017

2016

Detecting Logical Inconsistencies by Clustering Technique in Natural Language Requirements.

Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

IEICE Trans. Inf. Syst., 2016

Automatic Generation of UTP Models from Requirements in Natural Language.

Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the Ninth IEEE International Conference on Software Testing, 2016

Syntactic Rules of Extracting Test Cases from Software Requirements.

Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the 8th International Conference on Information Management and Engineering, 2016

2015

Semantic analysis technique of logics retrieval for software testing from specification documents.

Satoshi Masuda, Futoshi Iwama, Nobuhiro Hosokawa, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the Eighth IEEE International Conference on Software Testing, 2015

2014

Millimeter-Wave GaN HEMT for Power Amplifier Applications.

Kazukiyo Joshin, Kozo Makiyama, Shiro Ozaki, Toshihiro Ohki, Naoya Okamoto, Yoshitaka Niida, Masaru Sato, Satoshi Masuda, Keiji Watanabe

IEICE Trans. Electron., 2014

2013

A Method of Creating Testing Pattern for Pair-wise Method by Using Knowledge of Parameter Values.

Satoshi Masuda, Tohru Matsuodani, Kazuhiko Tsuda

Proceedings of the 17th International Conference in Knowledge Based and Intelligent Information and Engineering Systems, 2013

2003

An over-110-GHz InP HEMT flip-chip distributed baseband amplifier with inverted microstrip line structure for optical transmission system.

Satoshi Masuda, Tsuyoshi Takahashi, Kazukiyo Joshin

IEEE J. Solid State Circuits, 2003