Scott Allen

According to our database, Scott Allen authored at least 3 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

Recognition: capture(scene).

Rintaro Fujita, Scott Allen

Proceedings of the SIGGRAPH Asia 2024 Art Gallery, 2024

2022

Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs.

Satyaki Ganguly, Daniel J. Lichtenwalner, Caleb Isaacson, Donald A. Gajewski, Philipp Steinmann, Ryan Foarde, Brett Hull, Sei-Hyung Ryu, Scott Allen, John W. Palmour

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018

Reliability studies of SiC vertical power MOSFETs.

Daniel J. Lichtenwalner, Brett Hull, Edward Van Brunt, Shadi Sabri, Donald A. Gajewski, Dave Grider, Scott Allen, John W. Palmour, Akin Akturk, James McGarrity

Proceedings of the IEEE International Reliability Physics Symposium, 2018