Shreyas Nandi

According to our database, Shreyas Nandi authored at least 2 papers between 2020 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2021

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts.

Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.

Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee

Proceedings of the IEEE International Test Conference, 2020