Srinivasa Shashank Nuthakki

According to our database, Srinivasa Shashank Nuthakki authored at least 7 papers between 2015 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Effective Pre-Silicon Verification of Processor Cores by Breaking the Bounds of Symbolic Quick Error Detection.

Karthik Ganesan, Florian Lonsing, Srinivasa Shashank Nuthakki, Eshan Singh, Mohammad Rahmani Fadiheh, Wolfgang Kunz, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra

CoRR, 2021

2019

Unlocking the Power of Formal Hardware Verification with CoSA and Symbolic QED: Invited Paper.

Florian Lonsing, Karthik Ganesan, Makai Mann, Srinivasa Shashank Nuthakki, Eshan Singh, Mario Srouji, Yahan Yang, Subhasish Mitra, Clark W. Barrett

Proceedings of the International Conference on Computer-Aided Design, 2019

2018

Symbolic quick error detection using symbolic initial state for pre-silicon verification.

Mohammad Rahmani Fadiheh, Joakim Urdahl, Srinivasa Shashank Nuthakki, Subhasish Mitra, Clark W. Barrett, Dominik Stoffel, Wolfgang Kunz

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2016

Optimization of the IEEE 1687 access network for hybrid access schedules.

Srinivasa Shashank Nuthakki, Rajit Karmakar, Santanu Chattopadhyay, Krishnendu Chakrabarty

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Improved Test Pattern Generation for Hardware Trojan Detection using Genetic Algorithm and Boolean Satisfiability.

Sayandeep Saha, Rajat Subhra Chakraborty, Srinivasa Shashank Nuthakki, Anshul, Debdeep Mukhopadhyay

IACR Cryptol. ePrint Arch., 2015

Test set customization for improved fault diagnosis without sacrificing coverage.

Srinivasa Shashank Nuthakki, Santanu Chattopadhyay, Mrityunjoy Chakraborty

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

An Integrated Approach for Improving Compression and Diagnostic Properties of Test Sets.

Srinivasa Shashank Nuthakki, Santanu Chattopadhyay

Proceedings of the 24th IEEE Asian Test Symposium, 2015