Suraj Sindia

J. Electron. Test., 2015

Innovative practices session 2C: New technologies, new challenges - 2.

[BibT_eX]

[DOI]

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2014

A Test Time Theorem and its Applications.

[BibT_eX]

[DOI]

Praveen Venkataramani

J. Electron. Test., 2014

Specification test minimization for given defect level.

[BibT_eX]

[DOI]

Proceedings of the 15th Latin American Test Workshop, 2014

2013

Neural Network Guided Spatial Fault Resilience in Array Processors.

[BibT_eX]

[DOI]

J. Electron. Test., 2013

Finding best voltage and frequency to shorten power-constrained test time.

[BibT_eX]

[DOI]

Praveen Venkataramani

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

High sensitivity test signatures for unconventional analog circuit test paradigms.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing.

[BibT_eX]

[DOI]

J. Electron. Test., 2012

Towards spatial fault resilience in array processors.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Impact of process variations on computers used for image processing.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Tailoring Tests for Functional Binning of Integrated Circuits.

[BibT_eX]

[DOI]

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Testing linear and non-linear analog circuits using moment generating functions.

[BibT_eX]

[DOI]

Proceedings of the 12th Latin American Test Workshop, 2011

Test and Diagnosis of Analog Circuits Using Moment Generating Functions.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Parametric Fault Diagnosis of Nonlinear Analog Circuits Using Polynomial Coefficients.

[BibT_eX]

[DOI]

Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010

2009

Polynomial coefficient based DC testing of non-linear analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

Multi-tone Testing of Linear and Nonlinear Analog Circuits Using Polynomial Coefficients.

[BibT_eX]

[DOI]