Thomas Moon
Orcid: 0000-0001-8256-1183
According to our database1,
Thomas Moon
authored at least 17 papers
between 2010 and 2022.
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Bibliography
2022
BlueFMCW: random frequency hopping radar for mitigation of interference and spoofing.
EURASIP J. Adv. Signal Process., 2022
2020
IEEE Des. Test, 2020
2019
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition.
J. Electron. Test., 2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of the 16th USENIX Symposium on Networked Systems Design and Implementation, 2019
2018
Proceedings of the 27th IEEE Asian Test Symposium, 2018
2015
Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms.
IEEE Trans. Signal Process., 2015
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware.
J. Electron. Test., 2015
Proceedings of the 20th IEEE European Test Symposium, 2015
2014
Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery.
IEEE Trans. Instrum. Meas., 2014
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
2013
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
2012
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters.
Proceedings of the 2012 IEEE International Test Conference, 2012
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling.
Proceedings of the 2012 IEEE International Test Conference, 2012
2010
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010