David C. Keezer

According to our database, David C. Keezer authored at least 63 papers between 1985 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

Experimental Evaluation of Jitter Reduction Methods for Multi-Gigahertz Test.

David C. Keezer, Dany Minier, Hongjie Li

Proceedings of the IEEE International Test Conference in Asia, 2023

2019

Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition.

Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee

J. Electron. Test., 2019

A Framework for Design of Self-Repairing Digital Systems.

Jingchi Yang, David C. Keezer

Proceedings of the IEEE International Test Conference, 2019

2018

Securing Medical Devices Against Hardware Trojan Attacks Through Analog-, Digital-, and Physiological-Based Signatures.

Taimour Wehbe, Vincent John Mooney, Omer T. Inan, David C. Keezer

J. Hardw. Syst. Secur., 2018

Hardware-Based Run-Time Code Integrity in Embedded Devices.

Taimour Wehbe, Vincent John Mooney III, David C. Keezer

Cryptogr., 2018

A chip-level security framework for assessing sensor data integrity: work-in-progress.

Taimour Wehbe, Vincent John Mooney, David C. Keezer

Proceedings of the International Conference on Hardware/Software Codesign and System Synthesis, 2018

2017

Biologically inspired hierarchical structure for self-repairing FPGAs.

David C. Keezer, Jingchi Yang

Proceedings of the International Conference on ReConFigurable Computing and FPGAs, 2017

Use of Analog Signatures for Hardware Trojan Detection.

Taimour Wehbe, Vincent John Mooney, David C. Keezer, Omer T. Inan, Abdul Qadir Javaid

Proceedings of the 14th FPGAworld Conference, 2017

2016

A 40Gbps economic extension board and FPGA-based testing platform.

Te-Hui Chen, David C. Keezer

Proceedings of the 21th IEEE European Test Symposium, 2016

An Ultra-High-Speed Test Module and FPGA-Based Development Platform.

Te-Hui Chen, David C. Keezer

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

An FPGA-based ATE extension module for low-cost multi-GHz memory test.

David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo

Proceedings of the 20th IEEE European Test Symposium, 2015

A Novel Approach to Detect Hardware Trojan Attacks on Primary Data Inputs.

Taimour Wehbe, Vincent John Mooney, David C. Keezer, Nicholas B. Parham

Proceedings of the 10th Workshop on Embedded Systems Security, 2015

2014

Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms.

Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

A signature based architecture for Trojan detection.

Aderinola Gbade-Alabi, David C. Keezer, Vincent John Mooney, Axel York Poschmann, Marc Stöttinger, Kshitij Divekar

Proceedings of the 9th Workshop on Embedded Systems Security, 2014

2013

Practical methods for extending ATE to 40 and 50Gbps.

David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid

Proceedings of the 2013 IEEE International Test Conference, 2013

Minimizing simultaneous switching noise at reduced power with constant-voltage power transmission lines for high-speed signaling.

Satyanarayana Telikepalli, Madhavan Swaminathan, David C. Keezer

Proceedings of the International Symposium on Quality Electronic Design, 2013

Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus.

Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing.

Hsiu-Ming (Sherman) Chang, David C. Keezer

J. Electron. Test., 2012

Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter.

David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels.

Carl Edward Gray, David C. Keezer

J. Electron. Test., 2011

Multi-function multi-GHz ATE extension using state-of-the-art FPGAs.

A. M. Majid, David C. Keezer

Proceedings of the 2011 IEEE International Test Conference, 2011

Two methods for 24 Gbps test signal synthesis.

David C. Keezer, Carl Edward Gray

Proceedings of the Design, Automation and Test in Europe, 2011

Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet Switching Network Testing.

Carl Gray, David C. Keezer, Howard Wang, Keren Bergman

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.

David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme

J. Electron. Test., 2010

An architecture for graphics processing in an FPGA (abstract only).

Marcus Dutton, David C. Keezer

Proceedings of the ACM/SIGDA 18th International Symposium on Field Programmable Gate Arrays, 2010

Stretching the limits of FPGA SerDes for enhanced ATE performance.

A. M. Majid, David C. Keezer

Proceedings of the Design, Automation and Test in Europe, 2010

2009

A development platform and electronic modules for automated test up to 20 Gbps.

David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

VLSI Design, 2008

An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test.

David C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid

Proceedings of the 2008 IEEE International Test Conference, 2008

Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Multi-GHz loopback testing using MEMs switches and SiGe logic.

David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop

Proceedings of the 2007 IEEE International Test Conference, 2007

Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network.

Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman

Proceedings of the 2007 IEEE International Test Conference, 2007

Method for reducing jitter in multi-gigahertz ATE.

David C. Keezer, Dany Minier, Patrice Ducharme

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.

David C. Keezer, Dany Minier, Patrice Ducharme

IEEE Des. Test Comput., 2006

Multi-Gigahertz Testing of Wafer-Level Packaged Devices.

A. M. Majid, David C. Keezer, Jayasanker Jayabalan, Mihai Rotaru

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Implementing multi-gigahertz test systems using CMOS FPGAs and PECL components.

David C. Keezer, Carl Gray, Ashraf Majid, Nafeez Taher

Proceedings of the 31st European Solid-State Circuits Conference, 2005

Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL.

David C. Keezer, Carl Gray, Ashraf M. Majid, Nafeez Taher

Proceedings of the 2005 Design, 2005

A 5 Gbps Wafer-Level Tester.

A. M. Majid, David C. Keezer, J. V. Karia

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Multiplexing ATE Channels for Production Testing at 2.5 Gbps.

David C. Keezer, Dany Minier, Marie-Christine Caron

IEEE Des. Test Comput., 2004

Modular Extension of ATE to 5 Gbps.

David C. Keezer, Dany Minier, F. Binette

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A Production-Oriented Multiplexing System for Testing above 2.5 Gbps.

David C. Keezer, Dany Minier, Marie-Christine Caron

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober.

John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Multi-GigaHertz Testing Challenges and Solutions.

Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Challenges and Solutions for Multi-Gigahertz Testing.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Multi-Purpose Digital Test Core Utilizing Programmable Logic.

John S. Davis, David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Terabit-per-second automated digital testing.

David C. Keezer, Q. Zhou, C. Bair, J. Kuan, B. Poole

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

Test support processors for enhanced testability of high performance circuits.

David C. Keezer, Q. Zhou

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

A high throughput test methodology for MCM substrates.

Bruce C. Kim, David C. Keezer, Abhijit Chatterjee

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Alternative interface methods for testing high speed bidirectional signals.

David C. Keezer, Q. Zhou

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Improved sensitivity for parallel test of substrate interconnections.

David C. Keezer, K. E. Newman, John S. Davis

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates.

K. E. Newman, David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test.

David C. Keezer, R. J. Wenzel

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995

Electrical Troubleshooting, Diagnostics, and Repair of Multichip Modules.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1993

Known Godd Die for MCMs: Enabling Technologies.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

SMAC: A Scene Matching Chip.

N. Ranganathan, Raghu Sastry, Raguveer Venkatesan, Joseph W. Yoder, David C. Keezer

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1992

An Architecture for WSI Rapid Prototyping.

Vijay K. Jain, Hiroomi Hikawa, David C. Keezer

Computer, 1992

Calibration Techniques for a Gigahertz Test System.

David C. Keezer, R. J. Wenzel

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

MCM Test Using Available Technology.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Wafer Scale Integration: A university perspective.

Vijay K. Jain, David L. Landis, David C. Keezer, K. T. Wilson, Denny Whittaker

J. VLSI Signal Process., 1991

Real-Time Data Comparison for GigaHertz Digital Test.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

High Frequency Wafer Probing and Power Supply Resonance Effects.

S. P. Athan, David C. Keezer, J. McKinley

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Multiplexing test system channels for data rates above 1 Gb/s.

David C. Keezer

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1985

Tester Independent Support Software System (TISSS).

L. J. Falkenstrom, David C. Keezer, A. Patterson, Robert M. Rolfe, J. Wolcott

Proceedings of the Proceedings International Test Conference 1985, 1985