Toshifumi Watanabe

According to our database, Toshifumi Watanabe authored at least 11 papers between 2000 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

Prototype implementation of RFID based health management system with low-power ARM microcomputer.

Toshifumi Watanabe, Mizuki Murase, Katsuhiro Naito, Nobuyuki Ito, Katsuhiko Kaji, Naoya Chujo, Tadanori Mizuno

Proceedings of the 15th IEEE Annual Consumer Communications & Networking Conference, 2018

2017

Demo: Prototype implementation of ID card based momentum measurement system.

Naoki Yamamoto, Toshifumi Watanabe, Mizuki Murase, Katsuhiro Naito, Nobuyuki Ito, Katsuhiko Kaji, Naoya Chujo, Tadanori Mizuno

Proceedings of the 14th IEEE Annual Consumer Communications & Networking Conference, 2017

2013

A functional test of 2-GHz/4-GHz RF digital communication device using digital tester.

Kiyotaka Ichiyama, Masahiro Ishida, Kenichi Nagatani, Toshifumi Watanabe

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Integration of Silicon Nano-Photonic Devices for Telecommunications.

Seiichi Itabashi, Hidetaka Nishi, Tai Tsuchizawa, Toshifumi Watanabe, Hiroyuki Shinojima, Rai Kou, Koji Yamada

IEICE Trans. Electron., 2012

2009

On-Chip Optical Interconnect.

Keishi Ohashi, Kenichi Nishi, Takanori Shimizu, Masafumi Nakada, Junichi Fujikata, Jun Ushida, Sunao Torii, Koichi Nose, Masayuki Mizuno, Hiroaki Yukawa, Masao Kinoshita, Nobuo Suzuki, Akiko Gomyo, Tsutomu Ishi, Daisuke Okamoto, Katsuya Furue, Toshihide Ueno, Tai Tsuchizawa, Toshifumi Watanabe, Koji Yamada, Seiichi Itabashi, Jun Akedo

Proc. IEEE, 2009

2008

Effect of Post-Growth Annealing on Morphology of Ge Mesa Selectively Grown on Si.

Sungbong Park, Yasuhiko Ishikawa, Tai Tsuchizawa, Toshifumi Watanabe, Koji Yamada, Seiichi Itabashi, Kazumi Wada

IEICE Trans. Electron., 2008

LSI On-Chip Optical Interconnection with Si Nano-Photonics.

Junichi Fujikata, Kenichi Nishi, Akiko Gomyo, Jun Ushida, Tsutomu Ishi, Hiroaki Yukawa, Daisuke Okamoto, Masafumi Nakada, Takanori Shimizu, Masao Kinoshita, Koichi Nose, Masayuki Mizuno, Tai Tsuchizawa, Toshifumi Watanabe, Koji Yamada, Seiichi Itabashi, Keishi Ohashi

IEICE Trans. Electron., 2008

2003

Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Toshifumi Watanabe, Tadahiro Ohmi

IEEE Trans. Circuits Syst. II Express Briefs, 2003

2002

WCDMA Testing with a Baseband/IF Range AWG.

Koji Asami, Yasuo Furukawa, Michael Purtell, Motoo Ueda, Karl Watanabe, Toshifumi Watanabe

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method.

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Jitter measurements of a PowerPC^TM microprocessor using an analytic signal method.

Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, Toshifumi Watanabe

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000