V. Reddy

According to our database1, V. Reddy authored at least 3 papers between 2007 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2014
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.
Microelectron. Reliab., 2014

2007
Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation.
Microelectron. Reliab., 2007

S3: The IBM Smart Surveillance System: From Transactional Systems to Observational Systems.
Proceedings of the IEEE International Conference on Acoustics, 2007


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