Dhanoop Varghese
According to our database1,
Dhanoop Varghese
authored at least 7 papers
between 2004 and 2022.
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Bibliography
2022
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2014
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review.
Microelectron. Reliab., 2014
2007
Microelectron. Reliab., 2007
2004
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004