Vincent O'Brien

According to our database1, Vincent O'Brien authored at least 14 papers between 2009 and 2021.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2021
Metric Embedding Sub-discrimination Study.
CoRR, 2021

2020
High Order Mismatch Shaping for Low Oversampling Rates.
IEEE Trans. Circuits Syst. II Express Briefs, 2020

A Wideband 6th Order Programmable Bandpass DEM Implementation for a Nyquist DAC.
Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020

2018
Correction to: A Reduced Hardware ISI and Mismatch Shaping DEM Decoder.
Circuits Syst. Signal Process., 2018

A Reduced Hardware ISI and Mismatch Shaping DEM Decoder.
Circuits Syst. Signal Process., 2018

An In-Place Processor Design for Real-Value FFTs Targeting in-situ Dynamic ADC Test.
Proceedings of the IEEE 61st International Midwest Symposium on Circuits and Systems, 2018

2013
Experimental validation of DAC with nested bus-splitting EFM4 DDSM.
Proceedings of the 21st European Conference on Circuit Theory and Design, 2013

2011
A 100dB SFDR 0.5V pk-pk Band-Pass DAC Implemented on a Low Voltage CMOS Process.
Proceedings of the VLSI-SoC: Advanced Research for Systems on Chip, 2011

A high performance band-pass DAC architecture and design targeting a low voltage silicon process.
Proceedings of the IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, 2011

High order mismatch noise shaping for bandpass DACs.
Proceedings of the 18th IEEE International Conference on Electronics, Circuits and Systems, 2011

2009
A prototype platform for system-on-chip ADC test and measurement.
Proceedings of the Annual IEEE International SoC Conference, SoCC 2009, 2009

A2DTest: A complete integrated solution for on-chip ADC self-test and analysis.
Proceedings of the 2009 IEEE International Test Conference, 2009

An on-chip solution for static ADC test and measurement.
Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

An SOC platform for ADC test and measurement.
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009


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