Wangyong Chen

Orcid: 0000-0001-5545-2168

According to our database1, Wangyong Chen authored at least 5 papers between 2019 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2023
Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method.
Proceedings of the 15th IEEE International Conference on ASIC, 2023

Machine Learning-Assisted Single-Event Transient Model of 12nm FinFETs for Circuit-Level Simulation.
Proceedings of the 15th IEEE International Conference on ASIC, 2023

2021
A physics-based electromigration reliability model for interconnects lifetime prediction.
Sci. China Inf. Sci., 2021

2019
Modeling of program Vth distribution for 3-D TLC NAND flash memory.
Sci. China Inf. Sci., 2019

Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits.
Proceedings of the 13th IEEE International Conference on ASIC, 2019


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