Wanli Jiang

Orcid: 0009-0005-7121-828X

According to our database1, Wanli Jiang authored at least 19 papers between 1998 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2025
Improving Sample Efficiency Through Stability Enhancement in Deep-Reinforcement Learning.
IEEE Trans. Syst. Man Cybern. Syst., September, 2025

GraphGen: Enhancing Supervised Fine-Tuning for LLMs with Knowledge-Driven Synthetic Data Generation.
CoRR, May, 2025

MOSLIM:Align with diverse preferences in prompts through reward classification.
CoRR, May, 2025

SeedBench: A Multi-task Benchmark for Evaluating Large Language Models in Seed Science.
Proceedings of the 63rd Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers), 2025

2024
NVAutoNet: Fast and Accurate 360° 3D Visual Perception For Self Driving.
Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2024

2022
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors.
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

2021
Confidence Propagation Cluster: Unleash Full Potential of Object Detectors.
CoRR, 2021

2020
A real-time matching algorithm using sparse matrix.
Int. J. Grid Util. Comput., 2020

2017
An Online Approach for Gesture Recognition Toward Real-World Applications.
Proceedings of the Image and Graphics - 9th International Conference, 2017

2016
Silicon cavity resonator based on locally resonant phononic crystal.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2003
Performance Comparison of VLV, ULV, and ECR Tests.
J. Electron. Test., 2003

Effectiveness Improvement of ECR Tests.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
Statistical threshold formulation for dynamic I<sub>dd</sub> test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

2001
Defect-oriented test scheduling.
IEEE Trans. Very Large Scale Integr. Syst., 2001

Practical application of energy consumption ratio test.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
IC test using the energy consumption ratio.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1999
Statistical threshold formulation for dynamic I_dd test.
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998
Process-tolerant test with energy consumption ratio.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Fast State Verification.
Proceedings of the 35th Conference on Design Automation, 1998


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