Wen-Jer Tsai
Orcid: 0000-0002-9500-1959
According to our database1,
Wen-Jer Tsai authored at least 4 papers
between 2018 and 2026.
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Bibliography
2026
A Page-Buffer and Fail-Bit Counter-Based In-Memory Computing Platform for 3-D NAND Flash Memory.
IEEE J. Emerg. Sel. Topics Circuits Syst., June, 2026
2023
A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2018
Investigation of data pattern effects on nitride charge lateral migration in a charge trap flash memory by using a random telegraph signal method.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Chip-level characterization and RTN-induced error mitigation beyond 20nm floating gate flash memory.
Proceedings of the IEEE International Reliability Physics Symposium, 2018