Xiangfeng Lu

According to our database, Xiangfeng Lu authored at least 2 papers between 2019 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory.

Weihua Liu, Fei Wu, Xiang Chen, Meng Zhang, Yu Wang, Xiangfeng Lu, Changsheng Xie

ACM Trans. Storage, 2022

2019

Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash.

Weihua Liu, Fei Wu, Meng Zhang, Yifei Wang, Zhonghai Lu, Xiangfeng Lu, Changsheng Xie

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019