Y. Bert

According to our database, Y. Bert authored at least 1 paper in 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.

Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara

Microelectron. Reliab., 2011