Jean-Michel Portal

Orcid: 0000-0002-6722-053X

Affiliations:
  • Aix-Marseille University (AMU), France


According to our database1, Jean-Michel Portal authored at least 140 papers between 1997 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Powering AI at the Edge: A Robust, Memristor-based Binarized Neural Network with Near-Memory Computing and Miniaturized Solar Cell.
CoRR, 2023

1S1R Sub-Threshold Operation in Crossbar Arrays for Neural Networks Hardware Implementation.
Proceedings of the 30th International Conference on Mixed Design of Integrated Circuits and System, 2023

Energy-Efficient Bayesian Inference Using Near-Memory Computation with Memristors.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

Binary ReRAM-based BNN first-layer implementation.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

A Multimode Hybrid Memristor-CMOS Prototyping Platform Supporting Digital and Analog Projects.
Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022
Voltage-Dependent Synaptic Plasticity (VDSP): Unsupervised probabilistic Hebbian plasticity rule based on neurons membrane potential.
CoRR, 2022

Experimental Demonstration of Multilevel Resistive Random Access Memory Programming for up to Two Months Stable Neural Networks Inference Accuracy.
Adv. Intell. Syst., 2022

Experimental demonstration of Single-Level and Multi-Level-Cell RRAM-based In-Memory Computing with up to 16 parallel operations.
Proceedings of the IEEE International Reliability Physics Symposium, 2022


2021
Implementation of Ternary Weights With Resistive RAM Using a Single Sense Operation Per Synapse.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

A Memristor-Based Bayesian Machine.
CoRR, 2021

Model of the Weak Reset Process in HfOx Resistive Memory for Deep Learning Frameworks.
CoRR, 2021

A Regulated Sensing Solution Based on a Self-reference Principle for PCM + OTS Memory Array.
Proceedings of the VLSI-SoC: Technology Advancement on SoC Design, 2021

A Self-referenced and regulated sensing solution for PCM with OTS selector.
Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021

CAPC: A Configurable Analog Pop-Count Circuit for Near-Memory Binary Neural Networks.
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021

Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Ge-Se-Sb-N-based OTS scaling perspectives for high-density 1 S1R crossbar arrays.
Proceedings of the IEEE International Memory Workshop, 2021

Low-Overhead Implementation of Binarized Neural Networks Employing Robust 2T2R Resistive RAM Bridges.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

Storage Class Memory with Computing Row Buffer: A Design Space Exploration.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020
Ultra-High-density 3D vertical RRAM with stacked JunctionLess nanowires for In-Memory-Computing applications.
CoRR, 2020

Write Termination Circuits for RRAM: A Holistic Approach From Technology to Application Considerations.
IEEE Access, 2020

Embracing the Unreliability of Memory Devices for Neuromorphic Computing.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

In-Memory Resistive RAM Implementation of Binarized Neural Networks for Medical Applications.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Computational SRAM Design Automation using Pushed-Rule Bitcells for Energy-Efficient Vector Processing.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Low Power In-Memory Implementation of Ternary Neural Networks with Resistive RAM-Based Synapse.
Proceedings of the 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems, 2020

2019
Switching Event Detection and Self-Termination Programming Circuit for Energy Efficient ReRAM Memory Arrays.
IEEE Trans. Circuits Syst. II Express Briefs, 2019

Digital Biologically Plausible Implementation of Binarized Neural Networks with Differential Hafnium Oxide Resistive Memory Arrays.
CoRR, 2019

In-Memory and Error-Immune Differential RRAM Implementation of Binarized Deep Neural Networks.
CoRR, 2019

Stochastic Computing for Hardware Implementation of Binarized Neural Networks.
IEEE Access, 2019

Implementing Binarized Neural Networks with Magnetoresistive RAM without Error Correction.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2019

Light-Weight Cipher Based on Hybrid CMOS/STT-MRAM: Power/Area Analysis.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

Dual Detection of Heating and Photocurrent attacks (DDHP) Sensor using Hybrid CMOS/STT-MRAM.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Memory-Centric Neuromorphic Computing With Nanodevices.
Proceedings of the 2019 IEEE Biomedical Circuits and Systems Conference, 2019

Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks.
Proceedings of the IEEE International Conference on Artificial Intelligence Circuits and Systems, 2019

2018
An Ultra-Low Power and High Performance Single Ended Sense Amplifier for Low Voltage Flash Memories.
J. Low Power Electron., 2018

Reliable ReRAM-based Logic Operations for Computing in Memory.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Resistive and Spintronic RAMs: Device, Simulation, and Applications.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

RRAM Crossbar Arrays for Storage Class Memory Applications: Throughput and Density Considerations.
Proceedings of the Conference on Design of Circuits and Integrated Systems, 2018

2017
A Power Efficient Regulated Charge Pump Based on Charge Sharing for Contactless Devices: An Alternative to Four-Phase Charge Pumps.
J. Low Power Electron., 2017

High voltage recycling scheme to improve power consumption of regulated charge pumps.
Proceedings of the 27th International Symposium on Power and Timing Modeling, 2017

Power efficiency optimization of charge pumps in embedded low voltage NOR flash memory.
Proceedings of the IEEE Nordic Circuits and Systems Conference, 2017

An Ultra-Low Power and High Speed Single Ended Sense Amplifier for Non-Volatile Memories.
Proceedings of the New Generation of CAS, 2017

Architecture, design and technology guidelines for crosspoint memories.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2017

High density emerging resistive memories: What are the limits?
Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

Design methodology for area and energy efficient OxRAM-based non-volatile flip-flop.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

Thermal laser attack and high temperature heating on HfO2-based OxRAM cells.
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016
Resistive RAM variability monitoring using a ring oscillator based test chip.
Microelectron. Reliab., 2016

Optimization of a Particles Detection Chain Based on a VCO Structure.
J. Electron. Test., 2016

Capacitor based SneakPath compensation circuit for transistor-less ReRAM architectures.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2016

Multilevel operation in oxide based resistive RAM with SET voltage modulation.
Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

2015
Improvement of MOSFET matching characterization with calibrated multiplexed test structure.
Microelectron. Reliab., 2015

Dynamic current reduction of CMOS digital circuits through design and process optimization.
Proceedings of the 25th International Workshop on Power and Timing Modeling, 2015

SneakPath compensation circuit for programming and read operations in RRAM-based CrossPoint architectures.
Proceedings of the 15th Non-Volatile Memory Technology Symposium, 2015

Layout optimizations to decrease internal power and area in digital CMOS standard cells.
Proceedings of the 38th International Convention on Information and Communication Technology, 2015

Low cost built-in-tuning of on-chip passive filters for low-if double quadrature rf receiver.
Proceedings of the 16th Latin-American Test Symposium, 2015

Improvement of a detection chain based on a VCO concept for microelectronic reliability under natural radiative environment.
Proceedings of the 16th Latin-American Test Symposium, 2015

2014
Synchronous Non-Volatile Logic Gate Design Based on Resistive Switching Memories.
IEEE Trans. Circuits Syst. I Regul. Pap., 2014

Design and analysis of crossbar architecture based on complementary resistive switching non-volatile memory cells.
J. Parallel Distributed Comput., 2014

RRAM-based FPGA for "Normally Off, Instantly On" applications.
J. Parallel Distributed Comput., 2014

Low Power Radio Frequency Transceiver with Built-In-Tuning of the Local Oscillator for Open Loop Modulation.
J. Low Power Electron., 2014

OxRAM-based non volatile flip-flop in 28nm FDSOI.
Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Improvement of a VCO concept for low energy particule detection and recognition.
Proceedings of the 15th Latin American Test Workshop, 2014

An innovative standard cells remapping method for in-circuit critical parameters monitoring.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Printed complementary organic thin film transistors based decoder for ferroelectric memory.
Proceedings of the ESSCIRC 2014, 2014

Accurate multiplexed test structure for threshold voltage matching evaluation.
Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

Resistive memories: Which applications?
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013
A novel test structure for OxRRAM process variability evaluation.
Microelectron. Reliab., 2013

On the investigation of built-in tuning of RF receivers using on-chip polyphase filters.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Synchronous full-adder based on complementary resistive switching memory cells.
Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013

Analytical study of complementary memristive synchronous logic gates.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2013

DCG-FGT transistor: Retention study of Floating Gate charge.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

Built-in tuning of the local oscillator for open loop modulation of low cost, low power RF transceiver.
Proceedings of the 14th Latin American Test Workshop, 2013

SPICE level analysis of Single Event Effects in an OxRRAM cell.
Proceedings of the 14th Latin American Test Workshop, 2013

A hybrid CBRAM/CMOS Look-Up-Table structure for improving performance efficiency of Field-Programmable-Gate-Array.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Embedded high-precision frequency-based capacitor measurement system.
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Single-ended sense amplifier robustness evaluation for OxRRAM technology.
Proceedings of the 8th International Design and Test Symposium, 2013

A CBRAM-based compact interconnect switch for non-volatile reconfigurable logic circuits.
Proceedings of 2013 International Conference on IC Design & Technology, 2013

Low-cost auto-calibration of passive polyphase filter in image reject receiver.
Proceedings of the 20th IEEE International Conference on Electronics, 2013

2012
Non-Volatile Flip-Flop Based on Unipolar ReRAM for Power-Down Applications.
J. Low Power Electron., 2012

Effects of Lightly Doped Drain and Channel Doping Variations on Flash Memory Performances and Reliability.
J. Low Power Electron., 2012

Optimization of SEU Simulations for SRAM Cells Reliability under Radiation.
J. Electron. Test., 2012

Bipolar ReRAM Based non-volatile flip-flops for low-power architectures.
Proceedings of the 10th IEEE International NEWCAS Conference, 2012

Crossbar architecture based on 2R complementary resistive switching memory cell.
Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, 2012

A new adustable Schmitt Trigger based on Dual Control Gate-Floating Gate Transistor (DCG-FGT).
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

SITARe: A simulation tool for analysis and diagnosis of radiation effects.
Proceedings of the 13th Latin American Test Workshop, 2012

Built-in tuning of RFIC Passive Polyphase Filter by process and thermal monitoring.
Proceedings of the 13th Latin American Test Workshop, 2012

Investigation of a CMOS oscillator concept for particle detection and diagnosis.
Proceedings of the 13th Latin American Test Workshop, 2012

PSP based DCG-FGT transistor Model: Full characterization procedure.
Proceedings of the International Symposium on Communications and Information Technologies, 2012

2011
Back-end soft and hard defect monitoring using a single test chip.
Microelectron. Reliab., 2011

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.
Microelectron. Reliab., 2011

Using OxRRAM memories for improving communications of reconfigurable FPGA architectures.
Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 2011

Impact of SEU configurations on a SRAM cell response at circuit level.
Proceedings of the 12th Latin American Test Workshop, 2011

Analysis of SEU parameters for the study of SRAM cells reliability under radiation.
Proceedings of the 12th Latin American Test Workshop, 2011

Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

Bipolar OxRRAM memory array reliability evaluation based on fault injection.
Proceedings of the 6th IEEE International Design and Test Workshop, 2011

PSP based DCG-FGT transistor model including characterization procedure.
Proceedings of the 18th IEEE International Conference on Electronics, Circuits and Systems, 2011

Design challenges for prototypical and emerging memory concepts relying on resistance switching.
Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2009
Definition of an innovative filling structure for digital blocks : the DFM filler cell.
Proceedings of the 16th IEEE International Conference on Electronics, 2009

Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.
Proceedings of the 14th IEEE European Test Symposium, 2009

An on-line testing scheme for repairing purposes in Flash memories.
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

2008
A Novel Low Power Oriented Design Methodology for Analog Blocks.
J. Low Power Electron., 2008

Metal filling impact on standard cells: definition of the metal fill corner concept.
Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, 2008

A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories.
Proceedings of the 2008 IEEE International Test Conference, 2008

Predictive Delay Evaluation on Emerging CMOS Technologies: A Simulation Framework.
Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2006
MM11 based flash memory cell model including characterization procedure.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement.
J. Electron. Test., 2005

Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

A New Embedded Measurement Structure for eDRAM Capacitor.
Proceedings of the 2005 Design, 2005

2004
Efficient hardware implementation of a CRYPTO-MEMORY based on AES algorithm and SRAM architecture.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology.
Proceedings of the 2004 Design, 2004

2003
EEPROM Memory: Threshold Voltage Built In Self Diagnosis.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Infrastructure IP for Back-End Yield Improvement.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
An Automated Design Methodology for EEPROM Cell (ADE).
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Floating-gate EEPROM cell model based on MOS model 9.
Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

Floating-gate EEPROM cell: threshold voltage sensibility to geometry.
Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

2001
A Discussion on Test Pattern Generation for FPGA - Implemented Circuits.
J. Electron. Test., 2001

IS-FPGA : a new symmetric FPGA architecture with implicit scan.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

Analyzing bridging faults impact on EEPROM cell array.
Proceedings of the 6th European Test Workshop, 2001

2000
Testing the Local Interconnect Resources of SRAM-Based FPGA's.
J. Electron. Test., 2000

An Approach to Minimize the Test Configuration for the Logic Cells of the Xilinx XC4000 FPGAs Family.
J. Electron. Test., 2000

Some Experiments in Test Pattern Generation for FPGA-Implemented Combinational Circuits.
Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

Test Configuration Generation for FPGA Logic Cells.
Proceedings of the 1st Latin American Test Workshop, 2000

Analyzing the test generation problem for an application-oriented test of FPGAs.
Proceedings of the 5th European Test Workshop, 2000

TOF: a tool for test pattern generation optimization of an FPGA application oriented test.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999
SRAM-Based FPGAs: Testing the Embedded RAM Modules.
J. Electron. Test., 1999

Test configuration minimization for the logic cells of SRAM-based FPGAs: a case study.
Proceedings of the 4th European Test Workshop, 1999

Testing the Configurable Interconnect/Logic Interface of SRAM-Based FPGA's.
Proceedings of the 1999 Design, 1999

Minimizing the Number of Test Configurations for Different FPGA Families.
Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998
Testing the Interconnect of RAM-Based FPGAs.
IEEE Des. Test Comput., 1998

SRAM-based FPGA's: testing the LUT/RAM modules.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

SRAM-Based FPGAs: A Fault Model for the Configurable Logig Modules.
Proceedings of the Field-Programmable Logic and Applications, 1998

RAM-Based FPGA's: A Test Approach for the Configurable Logic.
Proceedings of the 1998 Design, 1998


SRAM-Based FPGA's: Testing the Interconnect/Logic Interface.
Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997
Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA.
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997


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