Y. Joly

According to our database, Y. Joly authored at least 2 papers in 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.

Y. Joly, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, Franck Julien, Pascal Fornara

Microelectron. Reliab., 2011

Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area.

Y. Joly, L. Truphemus, Laurent Lopez, Jean-Michel Portal, Hassen Aziza, Franck Julien, Pascal Fornara

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011