Yan-Hsiu Liu

According to our database, Yan-Hsiu Liu authored at least 8 papers between 2020 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly Imbalanced IC Defect Classification.

Hao-Chiang Shao, Chun-Hao Chang, Yu-Hsien Lin, Chia-Wen Lin, Shao-Yun Fang, Yan-Hsiu Liu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2026

Integrating Automatic Prompt Engineering and Vision-Language Model for Pad Defect Classification.

Yi-Ting Shen, Yan-Hsiu Liu, Yi-Ting Li, Wuqian Tang, Yung-Chih Chen, Hao-Chiang Shao, Chia-Wen Lin, Chun-Yao Wang

Proceedings of the 27th International Symposium on Quality Electronic Design, 2026

2025

LithoHoD: A Litho Simulator-Powered Framework for IC Layout Hotspot Detection.

Hao-Chiang Shao, Guan-Yu Chen, Yu-Hsien Lin, Chia-Wen Lin, Shao-Yun Fang, Pin-Yian Tsai, Yan-Hsiu Liu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2025

2023

Keeping Deep Lithography Simulators Updated: Global-Local Shape-Based Novelty Detection and Active Learning.

Hao-Chiang Shao, Hsing-Lei Ping, Kuo-Shiuan Chen, Weng-Tai Su, Chia-Wen Lin, Shao-Yun Fang, Pin-Yian Tsai, Yan-Hsiu Liu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2023

A Flexible Cluster Tool Simulation Framework with Wafer Batch Dispatching Time Recommendation.

Hsin-Ping Yen, Shiuan-Hau Huang, Yan-Hsiu Liu, Kuang-Hsien Tseng, Ji-Fu Kung, Yi-Ting Li, Yung-Chih Chen, Chun-Yao Wang

Proceedings of the 24th International Symposium on Quality Electronic Design, 2023

2021

From IC Layout to Die Photograph: A CNN-Based Data-Driven Approach.

Hao-Chiang Shao, Chao-Yi Peng, Jun-Rei Wu, Chia-Wen Lin, Shao-Yun Fang, Pin-Yen Tsai, Yan-Hsiu Liu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Cluster Tool Performance Analysis using Graph Database.

Shiuan-Hau Huang, Hsin-Ping Yen, Yan-Hsiu Liu, Kuang-Hsien Tseng, Ji-Fu Kung, Chia-Chun Lin, Yi-Ting Li, Yung-Chih Chen, Chun-Yao Wang

Proceedings of the 34th IEEE International System-on-Chip Conference, 2021

2020

From IC Layout to Die Photo: A CNN-Based Data-Driven Approach.

Hao-Chiang Shao, Chao-Yi Peng, Jun-Rei Wu, Chia-Wen Lin, Shao-Yun Fang, Pin-Yen Tsai, Yan-Hsiu Liu

CoRR, 2020