Yangyang Yan

Orcid: 0009-0005-9606-6817

According to our database1, Yangyang Yan authored at least 13 papers between 2014 and 2026.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2026
BloClaw: An Omniscient, Multi-Modal Agentic Workspace for Next-Generation Scientific Discovery.
CoRR, April, 2026

2025
Classification of nighttime light types in China's nature protected areas based on SDGSAT-1.
Int. J. Digit. Earth, December, 2025

Zero-Training Task-Specific Model Synthesis for Few-Shot Medical Image Classification.
CoRR, November, 2025

2024
AI Algorithm for Ultra-widefield Fundus Imaging for Diabetic Retinopathy - RDR, DME.
Proceedings of the Ultra-Widefield Fundus Imaging for Diabetic Retinopathy, 2024

AI-Based Diagnostic Model for Predicting ci-DME Development.
Proceedings of the Image-Based Prediction of Retinal Disease Progression, 2024

Image Quality Assessment with Model Fusion for Ultra-widefield Fundus.
Proceedings of the Ultra-Widefield Fundus Imaging for Diabetic Retinopathy, 2024

2022
DeepIDA: Predicting Isoform-Disease Associations by Data Fusion and Deep Neural Networks.
IEEE ACM Trans. Comput. Biol. Bioinform., 2022

Analyzing the Dynamic Spatiotemporal Changes in Urban Extension across Zhejiang Province Using NPP-VIIRS Nighttime Light Data.
Remote. Sens., 2022

Research on Ni<sub>3</sub>Sn<sub>4</sub> intermetallic compound for 5μm diameter Cu/Ni/Sn-3.0Ag micro bumps.
IEICE Electron. Express, 2022

2020
Influence of Fluid on Seal and Assembly of Pipeline Fittings Based on the Multiscale Finite Element Model.
Complex., 2020

2016
Low cost polyimide liner formation with vacuum-assisted spin coating for through-silicon-vias.
Proceedings of the 2016 IEEE International 3D Systems Integration Conference, 2016

2015
Vacuum-assisted-spin-coating of polyimide liner for high-aspect-ratio TSVs applications.
Proceedings of the 2015 International 3D Systems Integration Conference, 2015

2014
Analytical solution on interfacial reliability of 3-D through-silicon-via (TSV) containing dielectric liner.
Microelectron. Reliab., 2014


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