Yanning Chen
Orcid: 0000-0002-1337-9668
According to our database1,
Yanning Chen
authored at least 6 papers
between 2016 and 2023.
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Bibliography
2023
Microelectron. J., September, 2023
Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise.
Proceedings of the International Conference on IC Design and Technology, 2023
2022
A Miniaturized Ultrawideband Active Electric Probe With High Sensitivity for Near-Field Measurement.
IEEE Trans. Instrum. Meas., 2022
IEEE Access, 2022
2020
Int. J. Comput. Integr. Manuf., 2020
2016