Yaoru Hou

Orcid: 0000-0002-2659-966X

According to our database1, Yaoru Hou authored at least 5 papers between 2021 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2025
A 40nm 4Mb High-Reliability STT-MRAM Achieving 18ns Write-Time and 94.9% Wafer-Level-Die-Yield Across -55°C-to-125°C.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2025

AmPEC: Approximate MRAM with Partial Error Correction for Fine-grained Energy-quality Trade-off.
Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2023
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms.
IEEE Des. Test, June, 2023

A 28nm 2Mb STT-MRAM Computing-in-Memory Macro with a Refined Bit-Cell and 22.4 - 41.5TOPS/W for AI Inference.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2021
Cryogenic In-MRAM Computing.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2021


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