Yi He

Orcid: 0000-0001-7206-4845

Affiliations:
  • University of Chicago, IL, USA


According to our database1, Yi He authored at least 7 papers between 2019 and 2023.

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Bibliography

2023
Understanding and Mitigating Hardware Failures in Deep Learning Training Systems.
Proceedings of the 50th Annual International Symposium on Computer Architecture, 2023

Understanding Permanent Hardware Failures in Deep Learning Training Accelerator Systems.
Proceedings of the IEEE European Test Symposium, 2023

2022
Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Achieving Automotive Safety Requirements through Functional In-Field Self-Test for Deep Learning Accelerators.
Proceedings of the IEEE International Test Conference, 2022

2021
Efficient Functional In-Field Self-Test for Deep Learning Accelerators.
Proceedings of the IEEE International Test Conference, 2021

2020
FIdelity: Efficient Resilience Analysis Framework for Deep Learning Accelerators.
Proceedings of the 53rd Annual IEEE/ACM International Symposium on Microarchitecture, 2020

2019
Time-Slicing Soft Error Resilience in Microprocessors for Reliable and Energy-Efficient Execution.
Proceedings of the IEEE International Test Conference, 2019


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