According to our database1, Yibai He authored at least 3 papers between 2013 and 2015.
Legend:Book In proceedings Article PhD thesis Other
Flip-flops soft error rate evaluation approach considering internal single-event transient.
Sci. China Inf. Sci., 2015
Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology.
Sci. China Inf. Sci., 2014
A Scan Chain Based SEU Test Method for Microprocessors.
Proceedings of the Computer Engineering and Technology - 17th CCF Conference, 2013