Yiorgos Sfikas

According to our database, Yiorgos Sfikas authored at least 12 papers between 2009 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Deep Learning Based Detection of Anti-Reflective Obstacles in VLC Systems.

Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas

Proceedings of the International Conference on Artificial Intelligence in Information and Communication , 2024

2022

Signal decoding in an NLOS VLC system with the presence of anti-reflective obstacles.

Christoforos Papaioannou, Marina E. Plissiti, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas

Proceedings of the 10th IEEE International Black Sea Conference on Communications and Networking, 2022

2021

Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier.

Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas

J. Electron. Test., 2021

An efficient adaptive thresholding scheme for signal decoding in NLOS VLC systems.

Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas

Proceedings of the IEEE International Mediterranean Conference on Communications and Networking, 2021

2018

Aging monitoring in SRAM sense amplifiers.

Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas

Proceedings of the 7th International Conference on Modern Circuits and Systems Technologies, 2018

Periodic Aging Monitoring in SRAM Sense Amplifiers.

Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

2017

BTI and HCI degradation detection in SRAM cells.

Yiorgos Sfikas, Yiorgos Tsiatouhas

Proceedings of the 6th International Conference on Modern Circuits and Systems Technologies, 2017

Variation tolerant BTI monitoring in SRAM cells.

Yiorgos Sfikas, Yiorgos Tsiatouhas

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs.

Yiorgos Sfikas, Yiorgos Tsiatouhas

IEEE Trans. Computers, 2016

2015

On resistive open defect detection in DRAMs: The charge accumulation effect.

Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

Layout-Based Refined NPSF Model for DRAM Characterization and Testing.

Yiorgos Sfikas, Yiorgos Tsiatouhas, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2014

2009

Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing.

Yiorgos Sfikas, Yiorgos Tsiatouhas

Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009