Young-Yun Lee

According to our database¹, Young-Yun Lee authored at least 2 papers between 2018 and 2025.

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2025

Estimation of Remaining Useful Life from the Aging Degradation in IC Performance Parameters.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2018

Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018