Yu-Zheng Lin
Orcid: 0000-0001-7975-3694
According to our database1,
Yu-Zheng Lin authored at least 19 papers
between 2017 and 2026.
Collaborative distances:
Collaborative distances:
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Bibliography
2026
Cybersecur., December, 2026
IEEE Trans. Artif. Intell., April, 2026
CoRR, February, 2026
Proceedings of the 27th International Symposium on Quality Electronic Design, 2026
Photogrammetry-Enabled Digital Twins for Semiconductor Education and Workforce Development.
Proceedings of the Great Lakes Symposium on VLSI 2026, 2026
LLM-MC-Affect: LLM-Based Monte Carlo Modeling of Affective Trajectories and Latent Ambiguity for Interpersonal Dynamic Insight.
Proceedings of the 64th Annual Meeting of the Association for Computational Linguistics (Volume 1: Long Papers), 2026
2025
HWREx: AI-enabled Hardware Weakness and Risk Exploration and Storytelling Framework with LLM-assisted Mitigation Suggestion.
ACM Trans. Design Autom. Electr. Syst., November, 2025
Integrating Generative AI into Cybersecurity Education: A Study of OCR and Multimodal LLM-assisted Instruction.
CoRR, September, 2025
RAG-PRISM: A Personalized, Rapid, and Immersive Skill Mastery Framework with Adaptive Retrieval-Augmented Tutoring.
CoRR, September, 2025
Personalized Education with Generative AI and Digital Twins: VR, RAG, and Zero-Shot Sentiment Analysis for Industry 4.0 Workforce Development.
CoRR, February, 2025
CoRR, January, 2025
CoRR, January, 2025
LLM-HyPZ: Hardware Vulnerability Discovery Using an LLM-Assisted Hybrid Platform for Zero-Shot Knowledge Extraction and Refinement.
Proceedings of the IEEE International Conference on Data Mining, 2025
2024
Transforming Engineering Education Using Generative AI and Digital Twin Technologies.
CoRR, 2024
Proceedings of the IEEE Frontiers in Education Conference, 2024
Proceedings of the 21st IEEE/ACS International Conference on Computer Systems and Applications, 2024
2023
HW-V2W-Map: Hardware Vulnerability to Weakness Mapping Framework for Root Cause Analysis with GPT-assisted Mitigation Suggestion.
CoRR, 2023
Proceedings of the 14th IEEE Annual Ubiquitous Computing, 2023
2017
The construction of coherence microscope for extreme ultraviolet mask defect inspection in synchrotron facility.
Proceedings of the IEEE/SICE International Symposium on System Integration, 2017