Abalhassan Sheikh
Orcid: 0000-0001-8106-4732
According to our database1,
Abalhassan Sheikh
authored at least 13 papers
between 2018 and 2023.
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Bibliography
2023
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.
IEEE Des. Test, October, 2023
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.
J. Electron. Test., February, 2023
2022
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.
J. Electron. Test., December, 2022
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE European Test Symposium, 2022
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022
2021
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.
IEEE Trans. Instrum. Meas., 2021
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
Proceedings of the IEEE International Test Conference, 2021
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
Proceedings of the 26th IEEE European Test Symposium, 2021
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.
Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021
2020
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
2018
Fast and accurate linearity test for DACs with various architectures using segmented models.
Proceedings of the IEEE International Test Conference, 2018