Afsaneh Nassery

According to our database, Afsaneh Nassery authored at least 10 papers between 2009 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.

Jae Woong Jeong, Afsaneh Nassery, Jennifer N. Kitchen, Sule Ozev

IEEE Trans. Very Large Scale Integr. Syst., 2016

2015

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.

Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani

IEEE Trans. Very Large Scale Integr. Syst., 2015

2014

Built-In EVM Measurement With Negligible Hardware Overhead.

Ender Yilmaz, Afsaneh Nassery, Sule Ozev

IEEE Des. Test, 2014

2013

Zero-overhead self test and calibration of RF transceivers.

Afsaneh Nassery, Jae Woong Jeong, Sule Ozev

Proceedings of the 2013 IEEE International Test Conference, 2013

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.

Afsaneh Nassery, Sule Ozev, Mustapha Slamani

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction.

Afsaneh Nassery, Osman Emir Erol, Sule Ozev, Marian Verhelst

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.

Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode.

Afsaneh Nassery, Sule Ozev

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

Extraction of EVM from Transmitter System Parameters.

Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani

Proceedings of the 16th European Test Symposium, 2011

2009

Built-in EVM measurement for OFDM transceivers using all-digital DFT.

Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar

Proceedings of the 2009 IEEE International Test Conference, 2009