Ender Yilmaz

Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018

Design of aging aware 5 Gbps LVDS transmitter for automotive applications.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Built-in self-test for stability measurement of low dropout regulator.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2017

Evaluation of loop transfer function based dynamic testing of LDOs.

[BibT_eX]

[DOI]

Proceedings of the International Test Conference in Asia, 2017

2015

Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation.

[BibT_eX]

[DOI]

IEEE Des. Test, 2015

2014

Built-In EVM Measurement With Negligible Hardware Overhead.

[BibT_eX]

[DOI]

Afsaneh Nassery

IEEE Des. Test, 2014

2013

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2013

Efficient Process Shift Detection and Test Realignment.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Adaptive quality binning for analog circuits.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE European Test Symposium, 2013

Fault analysis and simulation of large scale industrial mixed-signal circuits.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

Adaptive reduction of the frequency search space for multi-vdd digital circuits.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

Electrical calibration of spring-mass MEMS capacitive accelerometers.

[BibT_eX]

[DOI]

Lingfei Deng

Vinay Kundur

Naveen Sai Jangala Naga

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Test Application for Analog/RF Circuits With Low Computational Burden.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Adaptive testing: Conquering process variations.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE European Test Symposium, 2012

Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

An industrial case study of analog fault modeling.

[BibT_eX]

[DOI]

Anne Meixner

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Adaptive multidimensional outlier analysis for analog and mixed signal circuits.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2011

Fast and Accurate DPPM Computation Using Model Based Filtering.

[BibT_eX]

[DOI]

Proceedings of the 16th European Test Symposium, 2011

2010

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.

[BibT_eX]

[DOI]

Proceedings of the 2011 IEEE International Test Conference, 2010

Accurate multi-specification DPPM estimation using layered sampling based simulation.

[BibT_eX]

[DOI]

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

2009

Analog Layout Generator for CMOS Circuits.

[BibT_eX]

[DOI]

Günhan Dündar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Built-in EVM measurement for OFDM transceivers using all-digital DFT.

[BibT_eX]

[DOI]

Proceedings of the 2009 IEEE International Test Conference, 2009

Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.

[BibT_eX]

[DOI]

Proceedings of the 27th International Conference on Computer Design, 2009

Adaptive test elimination for analog/RF circuits.

[BibT_eX]

[DOI]

Proceedings of the 46th Design Automation Conference, 2009

2008

Dynamic test scheduling for analog circuits for improved test quality.

[BibT_eX]

[DOI]

Proceedings of the 26th International Conference on Computer Design, 2008

2007

New layout generator for analog CMOS circuits.

[BibT_eX]

[DOI]