Jennifer Kitchen

According to our database1, Jennifer Kitchen authored at least 22 papers between 2007 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2020
In-Field Recovery of RF Circuits from Wearout Based Performance Degradation.
IEEE Trans. Emerg. Top. Comput., 2020

Adaptive Power Control Using Current Adjustment for Watt-Level Power Amplifiers in CMOS SOI.
IEEE Trans. Circuits Syst. II Express Briefs, 2020

A Dividerless Ring Oscillator PLL With 250fs Integrated Jitter Using Sampled Lowpass Filter.
IEEE Trans. Circuits Syst., 2020

Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test.
Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

Preservation of Phase Resolution with Wideband Integer-N Based Phase Modulators.
Proceedings of the 2020 IEEE Radio and Wireless Symposium, 2020

2019
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration.
IEEE Des. Test, 2019

Innovative Design for Test in State-of-the-Art Analog Systems.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

CMOS Power Drivers for Digital Transmitters: Challenges and Architectures.
Proceedings of the IEEE Radio and Wireless Symposium, 2019

A Multilevel Pulse-Width Modulated Class-E Power Amplifier.
Proceedings of the IEEE Radio and Wireless Symposium, 2019

2018
A built-in self-test technique for transmitter-only systems.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018

RF circuit authentication for detection of process Trojans.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.
ACM Trans. Design Autom. Electr. Syst., 2017

2016
Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers.
IEEE Trans. Very Large Scale Integr. Syst., 2016

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2016

Process independent gain measurement with low overhead via BIST/DUT co-design.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Post-production adaptation of RF circuits for application-specific performance metrics.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015
A self-compensating built-in self-test solution for RF phased array mismatch.
Proceedings of the 2015 IEEE International Test Conference, 2015

Robust amplitude measurement for RF BIST applications.
Proceedings of the 20th IEEE European Test Symposium, 2015

2009
Combined Linear and Δ-Modulated Switch-Mode PA Supply Modulator for Polar Transmitters.
IEEE J. Solid State Circuits, 2009

2008
A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision.
Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007
Combined Linear and Δ-Modulated Switched-Mode PA Supply Modulator for Polar Transmitters.
Proceedings of the 2007 IEEE International Solid-State Circuits Conference, 2007


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