Alessandra Menicucci

Affiliations:
  • Delft University of Technology, Netherlands


According to our database1, Alessandra Menicucci authored at least 13 papers between 2016 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Extending the NOEL-V Platform with a RISC-V Vector Processor for Space Applications.
J. Aerosp. Inf. Syst., 2023

2022
Improving CubeSat reliability: Subsystem redundancy or improved testing?
Reliab. Eng. Syst. Saf., 2022

Is RISC-V ready for Space? A Security Perspective.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

Preventing Soft Errors and Hardware Trojans in RISC-V Cores.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021
On-Board Decision Making in Space with Deep Neural Networks and RISC-V Vector Processors.
J. Aerosp. Inf. Syst., August, 2021

Open-source IP cores for space: A processor-level perspective on soft errors in the RISC-V era.
Comput. Sci. Rev., 2021

2020
On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore Processor.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019
Leveraging the Openness and Modularity of RISC-V in Space.
J. Aerosp. Inf. Syst., November, 2019

On the Criticality of Caches in Fault-Tolerant Processors for Space.
Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

Characterization of a RISC-V Microcontroller Through Fault Injection.
Proceedings of the Applications in Electronics Pervading Industry, Environment and Society, 2019

2018
The Case for RISC-V in Space.
Proceedings of the Applications in Electronics Pervading Industry, Environment and Society, 2018

2016
Qualitative techniques for System-on-Chip test with low-energy protons.
Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams.
Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016


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