Alexandra Feeley

According to our database1, Alexandra Feeley authored at least 4 papers between 2021 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Single-Event Latchup Vulnerability at the 7-nm FinFET Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2021


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