Andreas Gehring

According to our database, Andreas Gehring authored at least 7 papers between 2002 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

VSP - A gate stack analyzer.

Markus Karner, Andreas Gehring, M. Wagner, Robert Entner, Stefan Holzer, Wolfgang Goes, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr

Microelectron. Reliab., 2007

2005

Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling.

Markus Karner, Andreas Gehring, Stefan Holzer, Hans Kosina

Proceedings of the Large-Scale Scientific Computing, 5th International Conference, 2005

2004

Statistical simulation of gate dielectric wearout, leakage, and breakdown.

Andreas Gehring, Siegfried Selberherr

Microelectron. Reliab., 2004

Enhancement of breakdown voltage for Ni-SiC Schottky diodes utilizing field plate edge termination.

Tesfaye Ayalew, Andreas Gehring, Tibor Grasser, Siegfried Selberherr

Microelectron. Reliab., 2004

2003

Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices.

Andreas Gehring, Francisco Jimenez-Molinos, Hans Kosina, A. Palma, F. Gámiz, Siegfried Selberherr

Microelectron. Reliab., 2003

Improving SiC lateral DMOSFET reliability under high field stress.

Tesfaye Ayalew, Andreas Gehring, Jong Mun Park, Tibor Grasser, Siegfried Selberherr

Microelectron. Reliab., 2003

2002

Testing of IP Services & Applications in a Service Provider Environment.

Andreas Gehring

Proceedings of the Testing of Communicating Systems XIV, Applications to Internet Technologies and Services, Proceedings of the IFIP 14th International Conference on Testing Communicating Systems, 2002