Wolfgang Gös
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Bibliography
2023
Proceedings of the 46th MIPRO ICT and Electronics Convention, 2023
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
2022
Proceedings of the 45th Jubilee International Convention on Information, 2022
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2021
Proceedings of the 44th International Convention on Information, 2021
Proceedings of the IEEE International Memory Workshop, 2021
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.
Microelectron. Reliab., 2018
2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
Proceedings of the 45th European Solid State Device Research Conference, 2015
2014
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014
2009
Microelectron. Reliab., 2009
2008
Math. Comput. Simul., 2008
2007