Wolfgang Gös

According to our database1, Wolfgang Gös authored at least 12 papers between 2007 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2022
Spin Transfer Torques in Ultra-Scaled MRAM Cells.
Proceedings of the 45th Jubilee International Convention on Information, 2022

2021
Finite Element Method Approach to MRAM Modeling.
Proceedings of the 44th International Convention on Information, 2021

2020
On the impact of mechanical stress on gate oxide trapping.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM.
Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018
Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.
Microelectron. Reliab., 2018

2015
Characterization and modeling of reliability issues in nanoscale devices.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

On the volatility of oxide defects: Activation, deactivation, and transformation.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

The defect-centric perspective of device and circuit reliability - From individual defects to circuits.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014
Characterization and modeling of charge trapping: From single defects to devices.
Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2009
Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.
Microelectron. Reliab., 2009

2008
The effect of uniaxial stress on band structure and electron mobility of silicon.
Math. Comput. Simul., 2008

2007
VSP - A gate stack analyzer.
Microelectron. Reliab., 2007


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