Wolfgang Gös

This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.

Bibliography

2023

Back-Hopping in Ultra-Scaled MRAM Cells.

[BibT_eX]

[DOI]

Proceedings of the 46th MIPRO ICT and Electronics Convention, 2023

Comprehensive Modeling of Advanced Composite Magnetoresistive Devices.

[BibT_eX]

[DOI]

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022

Spin Transfer Torques in Ultra-Scaled MRAM Cells.

[BibT_eX]

[DOI]

Proceedings of the 45th Jubilee International Convention on Information, 2022

Spin Torques in ULTRA-Scaled MRAM Devices.

[BibT_eX]

[DOI]

Simone Fiorentini

Mario Bendra

Johannes Ender

Roberto Lacerda de Orio

Wolfgang Goes

Siegfried Selberherr

Viktor Sverdlov

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Finite Element Method Approach to MRAM Modeling.

[BibT_eX]

[DOI]

Roberto Lacerda de Orio

Wolfgang Goes

Viktor Sverdlov

Siegfried Selberherr

Proceedings of the 44th International Convention on Information, 2021

A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Memory Workshop, 2021

2020

On the impact of mechanical stress on gate oxide trapping.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM.

[BibT_eX]

[DOI]

Roberto Lacerda de Orio

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

2015

Characterization and modeling of reliability issues in nanoscale devices.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

On the volatility of oxide defects: Activation, deactivation, and transformation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

The defect-centric perspective of device and circuit reliability - From individual defects to circuits.

[BibT_eX]

[DOI]

Proceedings of the 45th European Solid State Device Research Conference, 2015

2014

Characterization and modeling of charge trapping: From single defects to devices.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE International Conference on IC Design & Technology, 2014

2009

Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2009

2008

The effect of uniaxial stress on band structure and electron mobility of silicon.

[BibT_eX]

[DOI]

Math. Comput. Simul., 2008

2007

VSP - A gate stack analyzer.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Wolfgang Gös

Bibliography

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