Francisco Jimenez-Molinos
Orcid: 0000-0002-8866-7568
According to our database1,
Francisco Jimenez-Molinos
authored at least 19 papers
between 2003 and 2023.
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Bibliography
2023
2022
Hardware implementation of self-organizing maps using memristors, a simulation study.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022
An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022
2021
Homogeneity problem for basis expansion of functional data with applications to resistive memories.
Math. Comput. Simul., 2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Behavioral modeling of multilevel HfO2-based memristors for neuromorphic circuit simulation.
Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020
Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020
2019
Estimation of the reset voltage in resistive RAMs using the charge-flux domain and a numerical method based on quasi-interpolation and discrete orthogonal polynomials.
Math. Comput. Simul., 2019
Math. Comput. Simul., 2019
A spline quasi-interpolation based method to obtain the reset voltage in Resistive RAMs in the charge-flux domain.
J. Comput. Appl. Math., 2019
J. Comput. Appl. Math., 2019
2018
Exploring resistive switching-based memristors in the charge-flux domain: A modeling approach.
Int. J. Circuit Theory Appl., 2018
2017
Semiempirical Modeling of Reset Transitions in Unipolar Resistive-Switching Based Memristors.
CoRR, 2017
Modelling Resistive Random Access Memories by means of Functional Principal Component Analysis.
Proceedings of the Advances in Mass Data Analysis of Images and Signals in Medicine, 2017
2003
Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices.
Microelectron. Reliab., 2003