Anil Kumar Gundu

According to our database, Anil Kumar Gundu authored at least 12 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Impact of Sheet Width and Silicon Height in 3D Stacked Nanosheet GAA Transistor Technology.

Anil Kumar Gundu, Volkan Kursun

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

2021

Novel low leakage and energy efficient dual-pullup/dual-pulldown repeater.

Anil Kumar Gundu, Volkan Kursun

Integr., 2021

Optimization of 3D Stacked Nanosheets in 5nm Gate-all-around Transistor Technology.

Anil Kumar Gundu, Volkan Kursun

Proceedings of the 34th IEEE International System-on-Chip Conference, 2021

2019

Low Leakage Clock Tree With Dual-Threshold- Voltage Split Input-Output Repeaters.

Anil Kumar Gundu, Volkan Kursun

IEEE Trans. Very Large Scale Integr. Syst., 2019

Energy Efficient Clock Distribution with Low-Leakage Multi-Vt Buffers.

Anil Kumar Gundu, Volkan Kursun

Proceedings of the 29th International Symposium on Power and Timing Modeling, 2019

2016

A New Sense Amplifier Topology with Improved Performance for High Speed SRAM Applications.

Anil Kumar Gundu, Mohammad S. Hashmi, Anuj Grover

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Modeling and yield estimation of SRAM sub-system for different capacities subjected to parametric variations.

Pulkit Sharma, Anil Kumar Gundu, Mohammad S. Hashmi

Proceedings of the 20th International Symposium on VLSI Design and Test, 2016

An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI.

Nidhi Batra, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover

Proceedings of the 20th International Symposium on VLSI Design and Test, 2016

A high speed low voltage latch type sense amplifier for non-volatile memory.

Disha Arora, Anil Kumar Gundu, Mohammad S. Hashmi

Proceedings of the 20th International Symposium on VLSI Design and Test, 2016

A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation.

Nidhi Batra, Shashwat Kaushik, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

A regression based methodology to estimate SNM for improving yield of 6T SRAM.

Anil Kumar Gundu, Mohammad S. Hashmi, Ramkesh Sharma

Proceedings of the IEEE 59th International Midwest Symposium on Circuits and Systems, 2016

2015

Statistical analysis and parametric yield estimation of standard 6T SRAM cell for different capacities.

Anil Kumar Gundu, Mohammad S. Hashmi, Ramkesh Sharma, Naushad Ansari

Proceedings of the 28th IEEE International System-on-Chip Conference, 2015