Bertrand Boudart
According to our database1,
Bertrand Boudart
authored at least 14 papers
between 2003 and 2015.
Collaborative distances:
Collaborative distances:
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Bibliography
2015
Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs.
Microelectron. Reliab., 2015
2013
Microelectron. Reliab., 2013
2012
Calendar and cycling ageing of activated carbon supercapacitor for automotive application.
Microelectron. Reliab., 2012
Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence.
Microelectron. Reliab., 2012
2011
Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour.
Microelectron. Reliab., 2011
Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition.
Microelectron. Reliab., 2011
Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy.
Microelectron. Reliab., 2011
2010
Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature.
Microelectron. Reliab., 2010
Supercapacitor ageing at constant temperature and constant voltage and thermal shock.
Microelectron. Reliab., 2010
2006
Comparative studies of Pt and Ir schottky contacts on undoped Al<sub>0.36</sub>Ga<sub>0.64</sub>N.
Microelectron. Reliab., 2006
2005
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress.
Microelectron. Reliab., 2004
2003
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectron. Reliab., 2003