Bhaskar Chatterjee

According to our database, Bhaskar Chatterjee authored at least 9 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Design of a 1.7-GHz low-power delay-fault-testable 32-b ALU in 180-nm CMOS technology.

Bhaskar Chatterjee, Manoj Sachdev

IEEE Trans. Very Large Scale Integr. Syst., 2005

Designing leakage tolerant, low power wide-OR dominos for sub-130nm CMOS technologies.

Bhaskar Chatterjee, Manoj Sachdev, Ram Krishnamurthy

Microelectron. J., 2005

2004

DFT for Delay Fault Testing of High-Performance Digital Circuits.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

IEEE Des. Test Comput., 2004

A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Leakage Control Techniques for Designing Robust, Low Power Wide-OR Domino Logic for sub-130 nm CMOS Technologies.

Bhaskar Chatterjee, Manoj Sachdev, Ram Krishnamurthy

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

A CPL-based dual supply 32-bit ALU for sub 180nm CMOS technologies.

Bhaskar Chatterjee, Manoj Sachdev, Ram Krishnamurthy

Proceedings of the 2004 International Symposium on Low Power Electronics and Design, 2004

Modeling and designing energy-delay optimized wide domino circuits.

Christine Kwong, Bhaskar Chatterjee, Manoj Sachdev

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

Effectiveness and scaling trends of leakage control techniques for sub-130nm CMOS technologies.

Bhaskar Chatterjee, Manoj Sachdev, Steven Hsu, Ram Krishnamurthy, Shekhar Borkar

Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003

2002

A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits.

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002