Carl Edward Gray

According to our database, Carl Edward Gray authored at least 13 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Understanding how technology can support social-emotional learning of children: a dyadic trauma-informed participatory design with proxies.

Naseem Ahmadpour, Lian Loke, Carl Gray, Yidan Cao, Chloe Macdonald, Rebecca Hart

Proceedings of the 2023 CHI Conference on Human Factors in Computing Systems, 2023

2021

Safety, Connection and Reflection: Designing with Therapists for Children with Serious Emotional Behaviour Issues.

Lian Loke, Aaron Blishen, Carl Gray, Naseem Ahmadpour

Proceedings of the CHI '21: CHI Conference on Human Factors in Computing Systems, 2021

2013

Practical methods for extending ATE to 40 and 50Gbps.

David C. Keezer, Carl Edward Gray, Te-Hui Chen, Ashraf Majid

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

An fpga based architecture for native protocol testing of multi-gbps source-synchronous devices.

Carl Edward Gray

PhD thesis, 2012

Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter.

David C. Keezer, Te-Hui Chen, Carl Edward Gray, Hyun Woo Choi, Sungyeol Kim, Seongkwan Lee, Hosun Yoo

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Extending a DWDM Optical Network Test System to 12 Gbps x4 Channels.

Carl Edward Gray, David C. Keezer

J. Electron. Test., 2011

Two methods for 24 Gbps test signal synthesis.

David C. Keezer, Carl Edward Gray

Proceedings of the Design, Automation and Test in Europe, 2011

Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet Switching Network Testing.

Carl Gray, David C. Keezer, Howard Wang, Keren Bergman

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.

David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme

J. Electron. Test., 2010

2009

A development platform and electronic modules for automated test up to 20 Gbps.

David C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme

Proceedings of the 2009 IEEE International Test Conference, 2009

2007

Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network.

Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman

Proceedings of the 2007 IEEE International Test Conference, 2007

2005

Implementing multi-gigahertz test systems using CMOS FPGAs and PECL components.

David C. Keezer, Carl Gray, Ashraf Majid, Nafeez Taher

Proceedings of the 31st European Solid-State Circuits Conference, 2005

Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL.

David C. Keezer, Carl Gray, Ashraf M. Majid, Nafeez Taher

Proceedings of the 2005 Design, 2005