Dale E. Hoffman

According to our database, Dale E. Hoffman authored at least 8 papers between 1988 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.

Dale E. Hoffman

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1999

Chip integration methodology for the IBM S/390 G5 and G6 custom microprocessors.

Robert M. Averill III, Keith G. Barkley, Michael A. Bowen, Peter J. Camporese, Allan H. Dansky, Robert F. Hatch, Dale E. Hoffman, Mark D. Mayo, Scott A. McCabe, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Howard H. Smith, David A. Webber, Patrick M. Williams

IBM J. Res. Dev., 1999

1998

Testing the 500-MHz IBM S/390 Microprocessor.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins

IEEE Des. Test Comput., 1998

Deep submicron design techniques for the 500 MHz IBM S/390 G5 custom microprocessor.

Dale E. Hoffman, Robert M. Averill III, Brian W. Curran, Yuen H. Chan, Allan H. Dansky, Robert F. Hatch, Timothy G. McNamara, Thomas J. McPherson, Gregory A. Northrop, Leon J. Sigal, Anthony Pelella, Patrick M. Williams

Proceedings of the International Conference on Computer Design: VLSI in Computers and Processors, 1998

1997

Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors.

Kenneth L. Shepard, Sean M. Carey, Ee Kin Cho, Brian W. Curran, Robert F. Hatch, Dale E. Hoffman, Scott A. McCabe, Gregory A. Northrop, A. E. (Rick) Seigler

IBM J. Res. Dev., 1997

Advanced microprocessor test strategy and methodology.

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen

IBM J. Res. Dev., 1997

Testing the 400-MHz IBM Generation-4 CMOS Chip.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1988

250-MHz advanced test systems.

Algirdas J. Gruodis, Dale E. Hoffman

IEEE Des. Test, 1988